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临床试验/IRCT20180407039212N1
IRCT20180407039212N1已完成未知

Effect of 810 nanometer (nm) low level diode laser irradiation on dental implant stability in posterior mandibular region .

Ahvaz University of Medical Sciences0 个研究点目标入组 28 人开始时间: 待定最近更新:

试验速览

阶段
未知
状态
已完成
入组人数
28

研究概览

简要总结

暂无简介。

研究设计

研究类型
Interventional

入排标准

年龄范围
no limit 至 no limit(—)
性别
All

入选标准

  • Need for posterior implant on the mandibular sides
  • Sufficient bone volume to receive implant without requiring bone augmentation(reconstruction)procedure in subject area

排除标准

  • Smoking habits
  • History of previous tooth extraction in the last six months in the selected area
  • System disease that effects osseointegration
  • Anticoagulant therapy
  • Systemic glucocorticoid therapy
  • History of radiotherapy in the craniofacial region
  • Acute infection in the mouth, uncontrolled or untreated periodontal disease
  • Patients without good oral hygiene

研究者

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