IRCT20211114053062N1招募中未知
Comparison of Diode Laser (940 nm) and Scalpel's Morbidity in Second Stage of Implant Surgeries
适应症
试验速览
- 阶段
- 未知
- 状态
- 招募中
- 入组人数
- 40
研究概览
简要总结
暂无简介。
研究设计
- 研究类型
- Interventional
入排标准
- 年龄范围
- 18 years 至 60 years（—）
- 性别
- All
入选标准
- •delayed loading dental implant
- •delayed insertion dental implant
- •two stage protocol of dental implant
- •healthy keratinized gingival tissues at least 3 mm
排除标准
- •failed dental implant
- •inflammation or peri-implant inflammation
- •radiolucent line around the dental implant
研究者
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